摘要
随着激光技术的快速发展,激光器芯片在多个行业里都有广泛的应用,包括通信、激光加工以及医疗等。激光器芯片的性能是直接影响激光系统的关键,当激光器芯片存在缺陷,很有可能导致整个激光系统的稳定性与可靠性减弱,目前腔体缺陷作为影响激光器芯片使用效果的主要因素,需要在激光器芯片使用期间,详细对芯片腔体缺陷进行检测。但是,传统的激光器芯片腔体缺陷检测方法存在检测精度低、速度慢等问题,难以满足大规模生产和高质量要求。为此,本文将针对图像分割技术进行分析,确保能够对图像中目标区域进行准确分割,保障激光器芯片腔体缺陷检测的效果,为今后激光器芯片腔体缺陷检测提供全新方向。
关键词: 图像分割;激光器芯片;腔体缺陷;检测方法
Abstract
With the rapid advancement of laser technology, laser chips have found extensive applications across multiple industries including communications, laser processing, and medical fields. The performance of laser chips directly determines the stability and reliability of laser systems. Defects in laser chips can significantly compromise system performance, making cavity defects—the primary factor affecting chip functionality—critical for thorough inspection during operation. However, traditional detection methods suffer from low accuracy and slow speed, failing to meet mass production and high-quality requirements. This paper analyzes image segmentation techniques to ensure precise target area division in images, thereby enhancing defect detection effectiveness. These findings provide a novel approach for future laser chip cavity defect analysis.
Key words: Image segmentation; Laser chip; Cavity defect; Detection method
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